Method and apparatus for extracting static pattern based on output of event-based sensor

ABSTRACT

A method of extracting a static pattern from an output of an event-based sensor. The method may include receiving an event signal from the event-based sensor in response to dynamic input, and extracting a static pattern associated with the dynamic input based on an identifier and time included in the event signal. The static pattern may be extracted from a map generated based on the identifier and time.

This is a reissue application of U.S. Pat. No. 9,921,643, which wasfiled as U.S. application Ser. No. 15/017,711 on Feb. 8, 2016 and issuedon Mar. 20, 2018, which claims priority from Korean Patent ApplicationNo. 10-2015-0059746, filed on Apr. 28, 2015 in the Korean IntellectualProperty Office, the disclosures of which are incorporated herein byreference in their entireties.

CROSS-REFERENCE TO RELATED APPLICATION

This application claims priority from Korean Patent Application No.10-2015-0059746, filed on Apr. 28, 2015, in the Korean IntellectualProperty Office, the disclosure of which is incorporated herein byreference in its entirety.

BACKGROUND

1. Field

Methods and apparatuses consistent with exemplary embodiments relate toprocessing an output of an event-based sensor.

2. Description of the Related Art

A human-computer interaction (HCI) operates in a user interface. Varioususer interfaces used to recognize user inputs may provide a naturalinteraction between humans and computers.

To recognize user input, various sensors may be used. To provide anatural interaction, a sensor quickly responding to a user input may beused. For example, various mobile devices may need to consume relativelylow power while performing various smart functions using a userinterface. Accordingly, there is a need for a sensor that has a lowpower consumption, a high response speed, and high reliability for thepurpose of sensing. In addition, because an output of a sensor isdetermined based on an operation characteristic of the sensor, there isa need for a scheme of processing the output of the sensor.

SUMMARY

Exemplary embodiments may address at least the above problems and/ordisadvantages and other disadvantages not described above. Also, theexemplary embodiments are not required to overcome the disadvantagesdescribed above, and an exemplary embodiment may not overcome any of theproblems described above.

According to an aspect of an exemplary embodiment, there is provided apattern extraction method including receiving a signal indicating anevent from an event-based sensor; extracting a static pattern based onan identification and time included in the received event signal; andoutputting the extracted static pattern,

According to another aspect of an exemplary embodiment, there isprovided a pattern extraction apparatus including an event-based sensorconfigured to output a signal indicating an event, the event signalcomprising time and an identification of the event and a processorconfigured to extract a static pattern based on the event signal and tooutput the extracted static pattern outside the pattern extractionapparatus.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and/or other aspects of exemplary embodiments will becomeapparent and more readily appreciated from the following detaileddescription of exemplary embodiments, taken in conjunction with theaccompanying drawings of which:

FIG. 1 is a block diagram illustrating a pattern extraction apparatusaccording to an exemplary embodiment;

FIG. 2 is a view illustrating a timestamp map according to an exemplaryembodiment;

FIG. 3 is a flow diagram illustrating a static pattern extraction resultaccording to an exemplary embodiment;

FIGS. 4 and 5 are views illustrating a ridge of a timestamp mapaccording to an exemplary embodiment;

FIG. 6 is a view illustrating a process of extracting a static patternbased on a threshold time interval according to an exemplary embodiment;

FIGS. 7 and 8 are flow diagrams illustrating a process of extracting astatic pattern when a minimum number of elements is set according to anexemplary embodiment;

FIGS. 9 and 10 are flow diagrams illustrating a process of extracting astatic pattern when a maximum number of elements is set according to anexemplary embodiment;

FIGS. 11 and 12 are views illustrating a process of extracting a staticpattern based on a thickness of an edge according to an exemplaryembodiment;

FIGS. 13 and 14 are views illustrating a process of extracting a staticpattern based on a plurality of regions set in a timestamp map accordingto an exemplary embodiment;

FIG. 15 is a block diagram illustrating another example of a patternextraction apparatus according to an exemplary embodiment;

FIG. 16 is a flow diagram illustrating a process of processing aplurality of timestamp maps according to an exemplary embodiment;

FIG. 17 is a flow diagram illustrating a result obtained by processing aplurality of timestamp maps according to an exemplary embodiment; and

FIG. 18 is a flowchart illustrating a pattern extraction methodaccording to an exemplary embodiment.

DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENTS

Reference will now be made in detail to exemplary embodiments, examplesof which are illustrated in the accompanying drawings, wherein likereference numerals refer to the like elements throughout. Exemplaryembodiments are described below with reference to the figures.

Particular structural or functional descriptions of exemplaryembodiments are merely intended for the purpose of illustration and theexemplary embodiments according to the concept of the present disclosuremay be implemented in various forms and should not be construed as beinglimited to those described in the present disclosure.

Various alterations and modifications may be made to exemplaryembodiments, some of which will be illustrated in detail in thedrawings. However, it should be understood that these exemplaryembodiments are not construed as limited to the illustrated forms andinclude all changes, equivalents or alternatives within the presentdisclosure.

Although terms of “first” or “second” are used to explain variouscomponents, the components are not limited to the terms. These terms areused only to distinguish one component from another component. Forexample, a first component may be referred to as a second component, orsimilarly, the second component may be referred to as the firstcomponent within the scope of the present disclosure.

It will be understood that when an element is referred to as being“connected” or “coupled” to another element, it can be directlyconnected or coupled to the other element or intervening elements may bepresent. In contrast, when an element is referred to as being “directlyconnected” or “directly coupled” to another element, there are nointervening elements present. Other words used to describe therelationship between elements or layers should be interpreted in a likefashion (for example, “between” versus “directly between,” or “adjacent”versus “directly adjacent”).

The terminology used herein is for the purpose of describing particularexemplary embodiments only and is not intended to be limiting ofexemplary embodiments. As used herein, the singular forms are intendedto include the plural forms as well, unless the context clearlyindicates otherwise. It will be further understood that the terms“comprises” and/or “comprising,” when used in this specification,specify the presence of stated features, integers, steps, operations,elements, components or a combination thereof, but do not preclude thepresence or addition of one or more other features, integers, steps,operations, elements, components, and/or groups thereof.

Unless otherwise defined herein, all terms used herein includingtechnical or scientific terms have the same meanings as those generallyunderstood by one of ordinary skill in the art. Terms defined indictionaries generally used should be construed to have meaningsmatching with contextual meanings in the related art and are notconstrued as an ideal or excessively formal meaning unless otherwisedefined herein.

FIG. 1 is a block diagram illustrating a pattern extraction apparatusaccording to an exemplary embodiment.

Referring to FIG. 1, a pattern extraction apparatus 100 includes anevent-based sensor 110 and a processor 130. The processor 130 may beimplemented by a microprocessor, a controller, a central processing unit(CPU), an arithmetic logic unit (ALU), a digital signal processor (DSP),a field programmable gate array (FPGA), a programmable logic unit (PLU),one or more general-purpose or special purpose computers capable ofresponding to and executing instructions, or various combinationsthereof.

In an exemplary embodiment, for convenience of description, an operationand a structure of a pattern extraction apparatus will be described,however, exemplary embodiments may be extended to various apparatuses.For example, exemplary embodiments may also be applicable to variouscomputing apparatuses including pattern extraction apparatuses, mobileapparatuses, or various security apparatuses. The mobile apparatuses mayinclude, for example, smartphones or wearable devices.

The event-based sensor 110 outputs an event signal in response to adynamic input. The event signal may include time information andidentification information corresponding to the dynamic input. Thedynamic input may include an event to change light incident on at leastone pixel in the event-based sensor 110. The identification informationmay be an address of a plurality of pixels included in the event-basedsensor 110. The time information may include a timestamp indicating atime at which the dynamic input is sensed by at least one pixel in theevent-based sensor 110. Hereinafter, a process by which the event-basedsensor 110 generates an event signal will further be described accordingto an exemplary embodiment.

The event-based sensor 110 may include a plurality of sensing pixels.The event-based sensor 110 may generate an event signal includingidentification information of an active pixel sensing an event among theplurality of sensing pixels. The event-based sensor 110 may use aneuromorphic sensing scheme, according to an exemplary embodiment.

The dynamic input may include an event to change light incident on atleast one pixel in the event-based sensor 110, as described above. Theevent may be, for example, an event associated with a change in aninput. The event may include, for example, an event in which anintensity of incident light changes, an event in which a color ofincident light changes, an event in which a volume of input soundchanges, an event in which a frequency of input sound changes, or anevent in which a strength of stimulation changes. The event-based sensor110 may be an event-based vision sensor. When the event-based sensor 110is an event-based vision sensor, the identification information mayinclude location information indicating at least one pixel sensing thedynamic input among a plurality of pixels included in the event-basedsensor 110. Hereinafter, for convenience of description, the event-basedsensor 110 is assumed as an event-based vision sensor to sense an eventin which an intensity of incident light changes, however, there is nolimitation thereto and this is provided by way of an example only.Accordingly, exemplary embodiments may also be applied to variousevent-based sensors.

The plurality of sensing pixels in the event-based sensor 110 may sensean event, for example, an event in which an intensity of incident lightchanges. A sensing pixel that senses an event among the plurality ofsensing pixels may be referred to as an “active pixel.” In response tothe active pixel sensing an event, an activation signal may begenerated.

The identification information may include location informationindicating at least one pixel sensing the dynamic input among aplurality of pixels included in the event-based sensor 110, as describedabove, according to an exemplary embodiment. The event-based sensor 110may generate the identification information of the active pixel. Forexample, the event-based sensor 110 may generate an event signalincluding location information to identify an active pixel based on anactivation signal generated by the active pixel. The event-based sensor110 may asynchronously generate and output an event signal andaccordingly, may operate at a high speed and low power in comparison toa frame-based vision sensor configured to scan all pixels for eachframe.

The identification information may be an address of a plurality ofpixels included in the event-based sensor 110. The event-based sensor110 may generate an asynchronous address event (AE) signal based onactive pixels. For example, when a change in a log intensity after alast event exceeds an upper threshold or a lower threshold, theevent-based sensor 110 may generate an ON event signal or an OFF eventsignal. The event-based sensor 110 may additionally generate timinginformation of the event signal. The event-based sensor 110 mayinterface with a synchronous system based on the timing information. Dueto a low density and a low latency of an output of the event-basedsensor 110, the event-based sensor 110 may be used for a high-speedobject tracking application requiring feedback of a quick response. Thehigh-speed object tracking application may include, for example,high-speed robotics.

An event-based sensor may be used to acquire an image from variousapparatuses including a smartphone, a tablet personal computer (PC), atelevision (TV) and a display. In an example, an event-based sensor maybe used in an interface of a smartphone. The event-based sensor may beused in, for example, a non-contact gesture recognition interface. Theinterface may be used to recognize a gesture to unlock a smartphone, agesture to turn up a volume of the smartphone, or a gesture to turn overpages on the smartphone. The event-based sensor may accurately andefficiently recognize a non-contact gesture. In another example, anevent-based sensor may be used in a security camera. In this example,the event-based sensor may be used to recognize an object that stopsmoving using the security camera.

The event-based sensor 110 may output an event signal. An output of anevent-based vision sensor may include an event signal corresponding to areal activity as well as an event signal corresponding to a backgroundnoise activity. The event signal corresponding to the background noiseactivity may be generated by a junction leakage current or a thermalnoise occurring in switches connected to floating nodes in sensingpixels of the event-based sensor 110.

To perform filtering on the event signal corresponding to the backgroundnoise activity, the event-based sensor 110 may generate a pass flag toidentify event signals that are spatiotemporally associated with eachother. Thus, the event-based sensor 110 may reduce a communication andcomputation load, and may enhance an information rate. In an exemplaryembodiment, because a background noise activity has a random pattern, itmay be easily removed through filtering using a spatial correlation byway of an example.

The event-based sensor 110 may use a power-gating scheme. Thepower-gating scheme may be a scheme of minimizing power consumption byactivating only a communication circuit and a threshold detectioncircuit corresponding to a sensing pixel that senses an event. Also, theevent-based sensor 110 may use a correlation filter chip. By using thecorrelation filter chip, the event-based sensor 100 may be applied to anembedded neuromorphic visual and auditory system requiring low powerconsumption and quick response.

The time information may include a timestamp indicating a time at whichthe dynamic input is sensed by at least one pixel in the event-basedsensor 110, as described above, according to an exemplary embodiment.The event-based sensor 110 may generate a timestamp indicating a time atwhich the dynamic input is sensed by an active pixel. In response to theactive pixel sensing an event, an activation signal may be generated. Inan example, the event-based sensor 110 may generate a timestamp based ona time at which an activation signal is generated. In another example,the processor 130 may generate a timestamp in response to the eventsignal being received from the event-based sensor 110.

The processor 130 extracts a static pattern associated with the dynamicinput, based on the event signal. As described above, according to anexemplary embodiment, the dynamic input may include an event to changelight incident on at least one pixel in the event-based sensor 110. Thestatic pattern may correspond to an appearance of an object associatedwith the dynamic input. For example, the dynamic input may include amotion of an object, and the static pattern may correspond to anappearance of the object in a state in which the motion stops.Hereinafter, according to an exemplary embodiment, a process by whichthe processor 130 extracts the static pattern will further be described.

The processor 130 may store the identification information and the timeinformation based on the event signal, and may extract the staticpattern based on the stored identification information and the storedtime information. For example, the processor 130 may extract the staticpattern based on history of the identification information and the timeinformation based. The identification information and the timeinformation may be stored in a memory 140 in the form of a timestampmap. The pattern extraction apparatus 100 may include a memory 140 tostore a timestamp map. A memory may be internal to the patternextraction apparatus or may be external thereto connected via a network.The memory may include a buffer, a flash memory, a hard drive, and soon. The timestamp map will be further described with reference to FIG. 2according to an exemplary embodiment.

FIG. 2 is a view illustrating a timestamp map according to an exemplaryembodiment. Referring to FIG. 2, a timestamp map 200 includes elementscorresponding to pixels in the event-based sensor 110. For example, anelement 201 stores a timestamp corresponding to a pixel located at (i,j) among pixels included in the event-based sensor 110.

Each of the elements in the timestamp map 200 may store a latest time atwhich a timestamp signal corresponding to each of the elements isreceived. For example, referring to FIG. 2, last time when a timestampsignal corresponding to the element 201 located at (i, j) is received isT_(i,j), and last time when a timestamp signal corresponding to anelement 202 located at (i, j+1) is received is T_(i,j+1). In thefollowing description, a time point in which a timestamp signal isreceived may be referred to as a “timestamp” according to an exemplaryembodiment.

When a timestamp signal is received, the processor 130 may update thetimestamp map 200 based on the received timestamp signal. For example,the processor 130 may detect an element corresponding to the receivedtimestamp signal among a plurality of elements included in the timestampmap 200, and may update a value stored in the detected element to atimestamp at which the timestamp signal is received.

The processor 130 may store a time in which a new timestamp signal isreceived in a millisecond (ms) or less or a microsecond (μs) or less,for each of the elements, according to an exemplary embodiment. Theprocessor 130 may extract the static pattern based on a timestamp of alast timestamp signal received in each of the elements, regardless of ahistory of timestamp signals received over time. Thus, the processor 130may extract the static pattern with a small amount of calculation and asmall memory capacity.

The processor 130 may overwrite the received time information using astorage element corresponding to the received identificationinformation. The processor 130 may discard a value stored in advance inthe storage element, and may store the received time information in thestorage element. The static pattern will further be described withreference to FIG. 3 according to an exemplary embodiment.

FIG. 3 is a flow diagram illustrating a static pattern extraction resultaccording to an exemplary embodiment. FIG. 3 illustrates an output 10based on an event signal at a time t₁, an output 21 based on an eventsignal at a time t₂, and a static pattern 22 extracted based on atimestamp map. In FIG. 3, the time t₁ corresponds to a state in which anobject is moving, and the time t₂ corresponds to a state in which theobject is stationary. The object exists in sensing area at the time t₁and t₂. Since the event-based sensor 110 may output an event signal inresponse to a dynamic input as described above, according to anexemplary embodiment, an output corresponding to the event signal maybasically change from the output 10 to the output 21 when the objectstops moving. However, when a pattern is extracted from a timestamp mapbased on a method that will be described below, according to anexemplary embodiment, the output 10 may be reconstructed in the form ofthe static pattern 22.

Referring back to FIG. 1, according to an exemplary embodiment, theprocessor 130 extracts the static pattern associated with the dynamicinput based on the identification information and the time informationincluded in the event signal. For example, the processor 130 may extractthe static pattern based on a ridge of a timestamp map. A timestamp of alast received timestamp signal may be stored in the timestamp map. Whenan object is moving, various timestamps may be stored in the timestampmap. When times of the timestamps are assumed as altitudes, timestampsin a predetermined time slot may form a ridge. The processor 130 mayextract the ridge from the timestamp map. The ridge will be furtherdescribed with reference to FIGS. 4 and 5, according to an exemplaryembodiment.

FIGS. 4 and 5 are views illustrating a ridge of a timestamp mapaccording to an exemplary embodiment. FIG. 4 illustrates a timestamp mapgenerated based on an event signal for a moving object. In FIG. 4, an Xaxis and a Y axis each represent location information of a pixel sensinga dynamic input, and a Z axis represents a timestamp. Accordingly, thelocation information may correspond to coordinates of the timestamp map,and time information may correspond to an altitude of the timestamp map.In FIG. 4, when the altitude increases, elements of the timestamp mapmay become dark. Accordingly, a darkest region of the timestamp map ofFIG. 4 may correspond to a ridge or peak of movement.

FIG. 5 is a two dimensional diagram of the timestamp map such as the oneshown in FIG. 4 according to an exemplary embodiment. In FIG. 5, an Xaxis and a Y axis each represent location information of a pixel sensinga dynamic input. Accordingly, the location information may correspond tocoordinates of the timestamp map. Also, “2.1” through “2.8” of a colormap in a right side of a graph of FIG. 5 may refer to timestamp valuesof a pixel sensing a dynamic input. For example, a region with a colorcorresponding to “2.8” in the timestamp map may include pixels having atimestamp value of “2.8.” As shown in FIG. 5, even though a movingobject stops, information on a movement of the object may remain in thetimestamp map. The information on the movement of the object may includemovement history of the object.

The darkest region corresponding to the ridge in the timestamp mapindicates information about a latest movement. For example, pixelshaving a timestamp value of “2.8” in the timestamp map may includeinformation about the latest movement. The processor 130 may extract astatic pattern based on the ridge of the timestamp map and accordingly,may provide information on an appearance of the object despite astationary state of the object, according to an exemplary embodiment.

Referring back to FIG. 1, the processor 130 extracts a ridge based onidentification information and time information of a timestamp map. Theprocessor 130 may determine the ridge using various schemes. In anexemplary embodiment, the processor 130 may determine a ridge based onelements storing time information within a threshold time interval amonga plurality of elements included in the timestamp map. In anotherexemplary embodiment, the processor 130 may track a ridge so that athickness of an edge included in the ridge may be equal to or less thana threshold thickness. Hereinafter, a process of determining a ridgewill further be described with reference to FIGS. 6 through 12 accordingto an exemplary embodiment.

FIG. 6 is a view illustrating a process of extracting a static patternbased on a threshold time interval according to an exemplary embodiment.FIG. 6 illustrates a 20×20 timestamp map with timestamps. The timestampmap of FIG. 6 shows that an object moved during a period from a time“29” to a time “36” and that a current time is now past the time “36.”

The processor 130 may determine a ridge based on elements storing timeinformation within a threshold time interval among a plurality ofelements included in a timestamp map. For example, the processor 130 mayset the threshold time interval based on a current time. According to anexemplary embodiment, elements corresponding to timestamps within thethreshold time interval based on the current time may be used todetermine a ridge.

For example, the processor 130 may set the threshold time interval to aunit time of “5” from the current time. When the current time is set toa time “40,” elements corresponding to timestamps, each having a valueequal to or greater than “35,” may be determined to form a ridge, asshown in the timestamp map of FIG. 6 according to an exemplaryembodiment.

The processor 130 may adjust a length of the threshold time intervalbased on a number of extracted elements. When a large number of elementsor a small number of elements exist during the threshold time interval,it may be difficult to recognize an appearance of an object.Accordingly, the processor 130 may adjust the length of the thresholdtime interval to a level suitable for recognition of the appearance ofthe object. For example, the processor 130 may set a reference value ofa number of elements included in a static pattern, and may adjust thelength of the threshold time interval based on the reference value. Thereference value may include at least one of a minimum value and amaximum value. In an exemplary embodiment, a reference value may be setin advance or may be dynamically adjusted based on a certain conditione.g., sharpness of a static pattern. The processor 130 may determine aridge based on elements storing time information within the thresholdtime interval with the adjusted length. When a minimum number ofelements is set to “25,” elements corresponding to timestamps, eachhaving a value of “35” or “36,” in the timestamp map of FIG. 6 may bedetermined to form a ridge. Hereinafter, a process of adjusting a numberof elements will be further described with reference to FIGS. 7 through10 according to an exemplary embodiment.

In an exemplary embodiment, a number of elements being extracted may betoo many or not enough, which would make it difficult to recognize anappearance of an object. In an exemplary embodiment, whether the numberof elements is too many or not enough may be determined based on areference value. The reference value may be experimentally determined.For example, an object is detected from a portion where a motion occurs,an image of the object is acquired from an event occurring during themotion, and a number of pixels used to generate the image is calculated.In this example, a number of pixels required to reconstruct the imagemay be predicted. In an event-based sensor, an event occurs in only aportion where a motion occurs, and accordingly in an exemplaryembodiment only the portion where the motion occurs is analyzedregardless of a portion where a motion does not occur at least once.

FIGS. 7 and 8 are flow diagrams illustrating a process of extracting astatic pattern when a minimum number of elements is set according to anexemplary embodiment. Referring to FIG. 7, a time diagram correspondingto an element in which an event is sensed shows a number of elements inwhich an event is sensed over time. In FIG. 7, the number of theelements in which the event is sensed may repeatedly increase anddecrease, which may indicate that a moving state and a stationary stateof an object are repeated.

Also, FIG. 7 illustrates an element included in a static pattern and anumber of elements used to extract the static pattern over time. Thenumber of the elements used to extract the static pattern may becontrolled by adjusting a length of a threshold time interval.

In FIG. 7, th₁ denotes a minimum number of elements. The processor 130may adjust a length of a threshold time interval so that the number ofthe elements included in the static pattern may be equal to or greaterthan the minimum number th₁. For example, in a portion 31 of FIG. 7, thenumber of the elements in which the event is sensed may decrease inresponse to an object being stationary according to an exemplaryembodiment.

In this example, the processor 130 may properly adjust the length of thethreshold time interval so that the number of the elements included inthe static pattern may be equal to or greater than the minimum numberth₁. When the length of the threshold time interval is properlyadjusted, a sharpness of the static pattern may be enhanced.

FIG. 8 illustrates an operation of the processor 130 to sharpen thestatic pattern for example in the portion 31 of FIG. 7, according to anexemplary embodiment. For example, when the number of the elements inthe static pattern is less than the minimum number th₁, the staticpattern may have low sharpness due to an insufficient number of elementsused to extract the static pattern. The processor 130 may increase anumber of elements used to extract the static pattern by increasing thelength of the threshold time interval (tp), to enhance the sharpness ofthe static pattern. As shown in FIG. 8, a sharpness of a static patternrepresenting an appearance of an object may increase in response to anincrease in the length of the threshold time interval.

FIGS. 9 and 10 are flow diagrams illustrating a process of extracting astatic pattern when a maximum number of elements is set according to anexemplary embodiment. FIG. 9 shows a number of elements over time, aminimum number th₁ of elements, and a maximum number th_(h) of elements.The processor 130 may adjust a length of a threshold time interval sothat a number of elements included in the static pattern may be equal toor greater than the minimum number th₁ and may be equal to or less thanthe maximum number th_(h). For example, in a portion 32 of FIG. 9, anumber of elements in which an event is sensed increases based on amovement of an object. In this example, the processor 130 may properlyadjust the length of the threshold time interval so that the number ofthe elements include in the static pattern may be equal to or less thanthe maximum number th_(h). When the length of the threshold timeinterval is properly adjusted, a sharpness of the static pattern may beenhanced. An exemplary embodiment of the minimum number th₁ has beendescribed above and accordingly, further description thereof will not berepeated here.

FIG. 10 is a flow diagram illustrating an image in which the timeinterval is decreased such as an operation of the processor 130 in theportion 32 of FIG. 9, according to an exemplary embodiment. For example,when the number of the elements in the static pattern is greater thanthe maximum number th_(h), an edge of the static pattern may beexcessively thickened and noise may occur in an appearance of an object,due to an extremely large number of elements used to extract the staticpattern. The processor 130 may properly control the number of elementsused to extract the static pattern by reducing the length of thethreshold time interval, to enhance a sharpness of the static pattern.As shown in FIG. 10, a sharpness of a static pattern representing anappearance of an object may increase in response to a decrease in thelength of the threshold time interval, according to an exemplaryembodiment.

As described above, according to an exemplary embodiment, the processor130 may track a ridge so that a thickness of an edge included in theridge may be equal to or less than a threshold thickness. A process oftracking a ridge will be further described with reference to FIGS. 11and 12.

FIGS. 11 and 12 are views illustrating a process of extracting a staticpattern based on a thickness of an edge according to an exemplaryembodiment. FIG. 11 illustrates a 20×20 timestamp map with timestamps.The timestamp map of FIG. 11 shows that an object moved during a periodfrom a time “29” to a time “36” and that a current time is after thetime “36.”

The processor 130 may track a ridge so that a thickness of an edgeincluded in the ridge may be equal to or less than a thresholdthickness. For example, when the thickness of the edge is determinedbased on a number of elements in an X-axis direction, and when athreshold thickness is set to “5,” elements or pixels corresponding totimestamps, each having a value between “33” and “36,” may be determinedto form a ridge, as shown in the timestamp map of FIG. 11, according toan exemplary embodiment. The thickness of the edge may be determined byvarious schemes. The thickness of the edge may be determined, forexample, based on a number of elements in an X-axis direction, a numberof elements in a Y-axis direction, a width perpendicular to a directionof the ridge, or various combinations thereof. This is provided by wayof an example and not by way of a limitation.

Tracking of a ridge may be applicable to an exemplary embodiment inwhich an object has a pattern. For example, when an object has apattern, pixels used to reconstruct the pattern as well as pixels usedto reconstruct a visible outline may be required. In an exemplaryembodiment, a plurality of pixels may be used to represent an appearanceof the object, in comparison to when an object does not have a pattern.Also, a static pattern may be properly extracted from a timestamp mapthrough tracking of a ridge based on a thickness of an edge.

Referring to FIG. 12, according to an exemplary embodiment, a movingobject may have a pattern, for example, a repetitive pattern. Forexample, when a number of elements, instead of a thickness of an edgeincluded in a ridge, is used to extract a static pattern, the staticpattern may have a low sharpness due to an insufficient number ofelements used to extract the pattern together with a visible outline ofthe object. Conversely, when the thickness of the edge in the ridge isdirectly used to extract a static pattern, a sharp appearance of anobject may be obtained as shown in static patterns 41 and 42 at pointsin time “1” and “2” based on a proper number of elements used to extractthe pattern together with the visible outline of the object.

A threshold thickness may be variously defined. For example, thethreshold thickness may be defined as a minimum thickness, an averagethickness and a maximum thickness among thicknesses of edges included ina ridge, or various combinations thereof. When the threshold thicknessis defined as the average thickness, the processor 130 may track theridge so that a thickness of each of the edges in the ridge may be equalto or less than the average thickness. The processor 130 may extract asharp static pattern of an object with a complex pattern by tracking aridge based on a thickness of an edge in the ridge according to anexemplary embodiment.

A process of extracting a static pattern in an example in which atimestamp map includes a single region has been described aboveaccording to an exemplary embodiment. According to yet another exemplaryembodiment, the timestamp map may include a plurality of regions. Theprocessor 130 may set a plurality of regions in a timestamp map, and mayextract a static pattern from each of the regions. When a plurality ofobjects exist, the processor 130 may set a plurality of regionscorresponding to the plurality of objects in a timestamp map. When aplurality of regions are set in a timestamp map, a static pattern ofeach of a plurality of objects may be clearly extracted, despite a timedifference between movements of the objects. The plurality of regionswill be further described with reference to FIGS. 13 and 14, accordingto an exemplary embodiment.

FIGS. 13 and 14 are views illustrating a process of extracting a staticpattern based on a plurality of regions set in a timestamp map accordingto an exemplary embodiment. FIG. 13 illustrates movements of an objectduring a period from a time t₁ to a time t₂, first static patterns 51and 52, and second static patterns 61 and 62. The first static patterns51 and 52 may be extracted from a single region, and the second staticpatterns 61 and 62 may be extracted from a plurality of regions. In thefollowing description of an exemplary embodiment, a hand and a head of auser may be referred to as a first object and a second object,respectively. In FIG. 13, the first object and the second object movetogether at the time t₁, and the second object moves at the time t₂.

When a single region is set in a timestamp map, a criterion to extract astatic pattern may be equally applied to the entire timestamp map. In anexemplary embodiment, when the first object and the second object movein overlapping time intervals in the time t₁, both an appearance of thefirst object and an appearance of the second object may be extracted asshown in the first static pattern 51. In another exemplary embodiment,when the first object does not move and the second object moves in thetime t₂, a ridge may be formed based on a movement of the second object.In this exemplary embodiment, the appearance of the second object may beextracted, as shown in the second static pattern 52 without the firstobject.

When a plurality of regions are set in a timestamp map, an appearance ofeach of the first object and the second object may be properlyextracted. When the plurality of regions are set, different criteria toextract a static pattern may be applied for each of the regions in thetimestamp map. For example, the processor 130 may set a criterion toextract a static pattern so that a ridge may be formed based on theappearance of the first object in a first region. Also, the processor130 may set another criterion to extract a static pattern so that aridge may be formed based on the appearance of the second object in asecond region, as shown in element 62 of FIG. 13.

FIG. 14 illustrates a first region 71 and a second region 72 for aplurality of objects in a timestamp map according to an exemplaryembodiment. The first region 71 and the second region 72 may correspondto the first object and the second object, respectively. The firstregion 71 may include elements corresponding to timestamps, each havinga value between “53” and “57.” The second region 72 may include elementscorresponding to timestamps, each having a value between “60” and “63.”Accordingly, the first object and the second object may be determined tosequentially move according to an exemplary embodiment. That is, in anexemplary embodiment, regions may be determined based on the timestamps.In other words, each region may correspond to a particular,non-overlapping range of timestamps such as region A, all timestampshaving values between 1 and 15, region B, all timestamps having valuesbetween 16 and 30. For example, when a hand of a user moves, timestampvalues maybe generated. Using these generated timestamp values, regionsmay be set. The above is provided by way of an example, not by way of alimitation. For example, regions may be determined by a pre-trainedclassifier.

The processor 130 may set the first region 71 and the second region 72based on a distribution of the timestamps. For example, the processor130 may set the first region 71 and the second region 72 based on a partof an object corresponding to a dynamic input. The processor 130 may setindividual criteria to extract a pattern for each of the first region 71and the second region 72. For example, the processor 130 may setindividual threshold time intervals for each of the first region 71 andthe second region 72. Also, the processor 130 may track a ridge based ona thickness of an edge included in the ridge from each of the firstregion 71 and the second region 72. The processor 130 may set individualthreshold thicknesses for each of the first region 71 and the secondregion 72. Hereinafter, a representative process of extracting a staticpattern based on a threshold time interval is described according to anexemplary embodiment, by way of an example and not by way of alimitation.

The processor 130 may extract a static pattern of the first object fromthe first region 71 based on a first threshold time interval for thefirst region 71, and may extract a static pattern of the second objectfrom the second region 72 based on a second threshold time interval forthe second region 72. For example, when a current time is set to “65” inthe timestamp map of FIG. 14, the first threshold time interval and thesecond threshold time interval may be set as unit times of “10” and “3,”respectively.

The above-described process of extracting a static pattern based on asingle region may be applied to a process of extracting a static patternbased on a plurality of regions. For example, the processor 130 mayadjust a length of a threshold time interval based on a number ofelements included in each of the first region 71 and the second region72. The processor 130 may adjust the length of the threshold timeinterval based on a number of valid event signals received based on eachof the first region 71 and the second region 72. The valid event signalsmay refer to event signals processed to be valid. Whether an eventsignal is valid may be determined based on a time at which the eventsignal is received. In response to a new event signal being receivedbased on each of the first region 71 and the second region 72, theprocessor 130 may adjust the length of the threshold time interval. Inother words, the processor 130 may adjust the length of the thresholdtime interval only when a new event signal is received. The abovedescription may be applicable to adjusting of the threshold timeinterval in the other situations. This is provided by way of an exampleonly and not by way of a limitation.

FIG. 15 is a block diagram illustrating a pattern extraction apparatusaccording to yet another exemplary embodiment.

Referring to FIG. 15, a pattern extraction apparatus 100-2 includes anevent-based sensor 110, a depth sensor 120, and a processor 130. Thepattern extraction apparatus 100-2 may generate a plurality of timestampmaps for each depth, and may extract static patterns from the pluralityof timestamp maps for each depth. The pattern extraction apparatus 100-2may properly reconstruct a static pattern of each of a plurality ofobjects by managing the plurality of timestamp maps for each depth,despite an occlusion between the objects.

The event-based sensor 110 outputs an event signal in response to adynamic input. The event signal may include identification informationand time information corresponding to the dynamic input. The abovedescription of the event-based sensor 110 and the processor 130 of FIG.1 may also be applicable, by way of an example, to the event-basedsensor 110 and the processor 130 of FIG. 15 and accordingly, furtherdescription of the event-based sensor 110 and the processor 130 of FIG.15 will not be repeated here.

The depth sensor 120 outputs depth information. The depth sensor 120includes a plurality of sensing pixels. The depth sensor 120 may outputdepth information sensed by the plurality of sensing pixels. The depthsensor 120 may have the same resolution as that of the event-basedsensor 110. In response to a dynamic input, the depth sensor 120 mayoutput depth information corresponding to the dynamic input. Althoughnot shown in FIG. 15, the depth sensor 120 may receive an event signal,and may output depth information sensed by a pixel corresponding tolocation information of the received event signal.

The processor 130 may generate a plurality of timestamp maps for each ofdifferent depths. The processor 130 may update one of the timestamp mapsbased on the event signal received from the event-based sensor 110 andthe depth information received from the depth sensor 120. For example,when first depth information is received in response to a first eventsignal, the processor 130 may update a timestamp based on the firstevent signal in a first timestamp map corresponding to a first depthregion. An operation of the processor 130 in association with aplurality of timestamp maps will be described with reference to FIGS. 16and 17, according to an exemplary embodiment.

FIG. 16 is a flow diagram illustrating a process of processing aplurality of timestamp maps according to an exemplary embodiment. FIG.16 illustrates the processor 130, a first timestamp map 210, a secondtimestamp map 220 and a third timestamp map 230. The first timestamp map210, the second timestamp map 220 and the third timestamp map 230 maycorrespond to a first depth region, a second depth region and a thirddepth region, respectively. The first timestamp map 210 through thethird timestamp map 230 may be referred to as two-dimensional (2D)timestamp maps.

When an event signal is received, the processor 130 may select atimestamp map corresponding to the event signal from the first timestampmap 210 through the third timestamp map 230 based on depth information.For example, when the depth information corresponds to the first depthregion, the processor 130 may select the first timestamp map 210. Theprocessor 130 may update the first timestamp map 210 based onidentification information and time information included in the eventsignal.

The processor 130 may extract a ridge from at least one of the firsttimestamp map 210 through the third timestamp map 230. An exemplaryprocess of extracting a ridge has been described above and accordingly,further description of the process will not be repeated here. Theprocessor 130 may extract a static pattern based on the extracted ridge.For example, the processor 130 may extract a plurality of staticpatterns from each of the first timestamp map 210 through the thirdtimestamp map 230. Also, the processor 130 may generate a singlecomposite map based on the first timestamp map 210 through the thirdtimestamp map 230, and may extract a static pattern based on a ridge ofthe composite map. When timestamps corresponding to the same coordinatesin the first timestamp map 210 through the third timestamp map 230overlap, the processor 130 may generate a single composite map based ona latest timestamp among the overlapping timestamps. For example, acomposite map may be generated based on a latest timestamp from allthree timestamp maps. In other words, in an exemplary embodiment, fromvarious timestamp maps (one for each depth), the highest value for eachpixel is obtained and one composite map is generated.

Exemplary embodiments may be modified to a scheme of generating athree-dimensional (3D) timestamp map, although not shown in thedrawings, instead of a plurality of 2D timestamp maps. For example, a 3Dtimestamp map may store a pair of time information and depth informationin an element corresponding to identification information. The processor130 may store time information and depth information in a storageelement corresponding to identification information.

In an exemplary embodiment, the depth information may be quantized topredetermined depth regions. In an exemplary embodiment, the processor130 may generate a 3D timestamp map including a pair of latest timeinformation and latest depth information for each of the depth regions.In response to a reception of new depth information quantized to thesame depth region as depth information of a pair of time information andthe depth information that are stored in advance, the processor 130 mayoverlap a pair of new time information and the new depth information ona corresponding element.

FIG. 17 is a flow diagram illustrating a result obtained by processing aplurality of timestamp maps according to an exemplary embodiment. FIG.17 illustrates static patterns 91, 92 and 93 extracted from a pluralityof timestamp maps. Each of the static patterns 91, 92 and 93 includes afirst object corresponding to a user's hand and a second objectcorresponding to a user's face. In FIG. 17, the first object and thesecond object are assumed to have different depths, and an arrow in eachof the static patterns 91 and 92 indicate a movement direction of thefirst object.

The processor 130 may update an event signal corresponding to the firstobject in a first timestamp map, and may update an event signalcorresponding to the second object in a second timestamp map.Accordingly, when an occlusion between the first object and the secondobject occurs, a static pattern of the first object and a static patternof the second object may be independently reconstructed. For example,referring to FIG. 17, an occlusion between the first object and thesecond object may occur between times t2 and t3. In this example, boththe first object and the second object may be independentlyreconstructed based on the plurality of timestamp maps as shown in thestatic pattern 93.

The processor 130 may set a plurality of regions in at least one of theplurality of timestamp maps. The processor 130 may set the plurality ofregions based on a distribution of timestamps. The processor 130 may setindividual criteria to extract a pattern for each of the regions. Forexample, the processor 130 may set individual threshold time intervalsfor each of the regions, and may adjust a length of each of thethreshold time intervals based on a number of elements included in eachof the regions. The above description may be applicable to a patternextraction process for the plurality of regions, according to anexemplary embodiment.

FIG. 18 is a flowchart illustrating a pattern extraction methodaccording to an exemplary embodiment.

Referring to FIG. 18, in operation 500, a pattern extraction apparatusreceives an event signal in response to a dynamic input. The eventsignal may be output by an event-based sensor. In operation 600, thepattern extraction apparatus extracts a static pattern associated withthe dynamic input based on identification information and timeinformation included in the event signal. The above-description of FIGS.1 through 17 is also applicable to the pattern extraction method of FIG.18, by way of an example, and accordingly, further description thereofwill not be repeated here.

In yet another exemplary embodiment, both the thickness of the edges andthe number of elements may be used to determine a static patternassociated with the event signal. In an exemplary embodiment, the numberof elements may be adjusted so that an edge may have a preset thickness.For example, when an object is moving, an event signal may be generatedin an edge of the object, and the number of elements may be adjusted sothat edges corresponding to the event signal may continue to have athickness of average about 2 pixels. This is provided by way of anexample and not by way of a limitation. In an exemplary embodiment, acombination of the thickness of the edges and the number of elements maybe used to generate the pattern.

The elements or components described herein may be implemented usinghardware components, software components, or a combination thereof. Forexample, the hardware components may include microphones, amplifiers,bandpass filters, audio to digital convertors, and processing devices. Aprocessing device may be implemented using one or more general-purposeor special purpose computers, such as, for example, a processor, acontroller and an ALU, a DSP, a microcomputer, an FPGA, a PLU, amicroprocessor or any other device capable of responding to andexecuting instructions in a defined manner. The processing device mayrun an operating system (OS) and one or more software applications thatrun on the OS. The processing device also may access, store, manipulate,process, and create data in response to execution of the software. Forpurpose of simplicity, the description of a processing device is used assingular; however, one skilled in the art will appreciated that aprocessing device may include multiple processing elements and multipletypes of processing elements. For example, a processing device mayinclude multiple processors or a processor and a controller. Inaddition, different processing configurations are possible, such aparallel processors.

The software may include a computer program, a piece of code, aninstruction, or some combination thereof, to independently orcollectively instruct or configure the processing device to operate asdesired. Software and data may be embodied permanently or temporarily inany type of machine, component, physical or virtual equipment, computerstorage medium or device, or in a propagated signal wave capable ofproviding instructions or data to or being interpreted by the processingdevice. The software also may be distributed over network coupledcomputer systems so that the software is stored and executed in adistributed fashion. The software and data may be stored by one or morenon-transitory computer readable recording mediums.

The above-described exemplary embodiments may be recorded innon-transitory computer-readable media including program instructions toimplement various operations which may be performed by a computer. Themedia may also include, alone or in combination with the programinstructions, data files, data structures, and the like. The programinstructions recorded on the media may be those specially designed andconstructed for the purposes of the exemplary embodiments, or they maybe of the well-known kind and available to those having skill in thecomputer software arts. Examples of non-transitory computer-readablemedia include magnetic media such as hard disks, floppy disks, andmagnetic tape; optical media such as CD ROM discs and DVDs;magneto-optical media such as optical discs; and hardware devices thatare specially configured to store and perform program instructions, suchas read-only memory (ROM), random access memory (RAM), flash memory, andthe like. Examples of program instructions include both machine code,such as code produced by a compiler, and files containing higher levelcode that may be executed by the computer using an interpreter. Thedescribed hardware devices may be configured to act as one or moresoftware modules in order to perform the operations of theabove-described exemplary embodiments, or vice versa.

Although a few exemplary embodiments have been shown and described, thepresent inventive concept is not limited thereto. Instead, it will beappreciated by those skilled in the art that changes, modifications, andvariations may be made to these exemplary embodiments without departingfrom the principles and spirit of the disclosure, the scope of which isdefined by the claims and their equivalents.

What is claimed is:
 1. A pattern extraction method comprising: receivingan event signal indicating an event from an event-based sensor;extracting a static pattern, which represents an object, based on anidentification and time included in the event signal; and outputting theextracted static pattern, wherein the identification comprises locationinformation of each of a plurality of pixels of the event-based sensorthat sensed the event and the time comprises a time point in which theevent is detected by a respective pixel from among said each pixel, andwherein the extracting comprises generating a map comprising a pluralityof elements corresponding to the location information of the pluralityof pixels of the event-based sensor in which the time point is a valueof a respective element from among the plurality of elements, whereinthe map is a three dimensional (3D) map and the extracting comprisesextracting a ridge from the 3D map generated based on the identificationand the time.
 2. The pattern extraction method of claim 1, furthercomprising: detecting the event, which is a motion event, by theevent-based sensor, which is a motion sensor, based on dynamic input,wherein the dynamic input comprises an event to change at least one ofcolor and intensity of light incident on at least one pixel from amongthe plurality of pixels in the event-based sensor.
 3. The patternextraction method of claim 2, wherein the static pattern is anappearance of the object in a motionless state associated with thedynamic input.
 4. The pattern extraction method of claim 1, wherein theevent indicates a motion of the object, and wherein the static patterncorresponds to an appearance of the object in a state in which themotion stops.
 5. The pattern extraction method of claim 1, wherein thelocation information indicates the each pixel that senses a motion ofthe object among the plurality of pixels of the event-based sensor. 6.The pattern extraction method of claim 1, wherein the time point is atimestamp in which the event is detected based on sensing dynamic inputby the each pixel.
 7. The pattern extraction method of claim 1, whereinthe extracting comprises: storing the identification and the time foreach of a plurality of received events; and extracting the staticpattern based on the identification and the time.
 8. The patternextraction method of claim 7, wherein the storing comprises: storing,for each element of the event-based sensor, the identificationcomprising address of the element and the time indicating last change ofthe respective element; and in response to an event changing a state ofthe respective element, overwriting the time for the respective elementin the address for the respective element.
 9. The pattern extractionmethod of claim 1, wherein the map is a three dimensional (3D) map andthe extracting comprises extracting a ridge from the 3D map generatedbased on the identification and the time.
 10. The pattern extractionmethod of claim 9 1, wherein the identification corresponds tocoordinate values on the 3D map, and the time corresponds to an altitudeon the 3D map.
 11. The pattern extraction method of claim 9 1, whereinthe extracting of the ridge comprises extracting at least two elementsof the plurality of elements which store the time within a thresholdtime interval among the plurality of elements included in the 3D map.12. The pattern extraction method of claim 11, wherein the extracting ofthe ridge further comprises: generating a new threshold time interval byadjusting a length of the threshold time interval based on a number ofthe elements that are extracted; and extracting the at least twoelements within the new threshold time interval.
 13. The patternextraction method of claim 9 1, wherein the extracting of the ridgecomprises tracking the ridge so that a thickness of an edge in the ridgeis equal to or less than a threshold thickness.
 14. The patternextraction method of claim 1, wherein the extracting comprises: settinga region of the map from which the static pattern is to be extracted;and extracting a the ridge from the region based on a threshold timeinterval.
 15. The pattern extraction method of claim 14, wherein thesetting comprises setting the region based on a part of the objectcorresponding to dynamic input which generates the event of theevent-based sensor.
 16. The pattern extraction method of claim 14,wherein the extracting the ridge further comprises at least one of:adjusting a length of the threshold time interval based on a number ofvalid event signals received in the region; and adjusting the length ofthe threshold time interval in response to a new event signal beingreceived in the set region.
 17. The pattern extraction method of claim1, wherein the extracting further comprises: receiving depth informationcorresponding to dynamic input sensed by the event-based sensor; storingthe depth information in a corresponding element from among theplurality of elements; and extracting the static pattern based on thelocation, the time point, and the depth information.
 18. A computerprogram stored in a non-transitory computer-readable recording medium toimplement the method of claim 1 through a combination with hardware. 19.The pattern extraction method of claim 1, further comprising: receivingat least one additional signal indicating at least one additional evenevent from the event-based sensor; and updating at least one point inthe map based on the identification and the time, wherein the extractingof the static pattern is asynchronous from the generating and theupdating of the map, and whereingwherein the location is an (x, y)location for each sensing element of the event-based sensor and the timepoint is the value for each of the (x, y) location.
 20. The patternextraction method of claim 1, wherein the event-based sensor outputs theinformation and the time only for sensing elements of the sensor thatchanged value from off to on or vice versa forming the event.
 21. Apattern extraction method comprising: receiving an event signalindicating an event from an event-based sensor; extracting a pattern,which represents a motionless object, based on an identification andtime included in the event signal; and outputting the pattern, whereinthe extracting comprises: generating a plurality of maps correspondingto a plurality of depth regions based on the identification and thetime; and extracting a ridge from at least one of the plurality of maps.22. The pattern extraction method of claim 21, wherein the generatingcomprises: receiving depth information corresponding to dynamic inputsensed by the event-based sensor; selecting a map from the plurality ofmaps based on the depth information; and updating the map based on theidentification and the time.
 23. A pattern extraction apparatuscomprising: an event-based sensor configured to output an event signalindicating an event, the event signal comprising time and anidentification of the event; and a processor configured to extract astatic pattern, which represents an object, based on the event signaland to output the extracted static pattern outside the patternextraction apparatus, wherein the identification comprises locationinformation of each of a plurality of pixels of the event-based sensorthat sensed the event and the time comprises a time point in which theevent is detected by a respective pixel from among said each pixel, andwherein the processor is configured to extract the static pattern bygenerating a map comprising a plurality of elements corresponding to thelocation information of the plurality of pixels of the event-basedsensor in which the time point is a value of a respective element fromamong the plurality of elements, and wherein the processor is configuredto extract a ridge from the map, which is a 3D map.
 24. The patternextraction apparatus of claim 23, wherein the event-based sensor outputsthe event signal, which is a motion event, in response to sensingdynamic input, which comprises a change of light incident on at leastone pixel from among the plurality of pixels in the event-based sensor.25. The pattern extraction apparatus of claim 24, wherein theevent-based sensor outputs the event signal in response to sensing thedynamic input, which comprises a motion of the object, and wherein thestatic pattern is an appearance of the object in a state in which themotion stops.
 26. The pattern extraction apparatus of claim 23, whereinthe location indicates each pixel of the event-based sensor that sensesdynamic input among the plurality of pixels of the event-based sensor,and wherein the time point is a timestamp in which the event is detectedbased on sensing dynamic input by the each pixel.
 27. The patternextraction apparatus of claim 23, wherein the processor is configured tostore the identification and the time in a memory, and to extract thestatic pattern based on the identification and the time.
 28. The patternextraction apparatus of claim 27, wherein the processor is configured tooverwrite the time in an element from among the plurality of elementscorresponding to the identification based on the event detected by theevent-based sensor.
 29. The pattern extraction apparatus of claim 23,wherein the processor is configured to extract a ridge from the map,which is a 3D map, and wherein the location is coordinate values on themap, and the time is an altitude on the map.
 30. The pattern extractionapparatus of claim 29, wherein the processor is configured to extract atleast two elements from among the plurality of elements storing timewithin a threshold time interval among the plurality of elementsincluded in the map.
 31. The pattern extraction apparatus of claim 30,wherein the processor is configured to generate a new threshold timeinterval by adjusting a length of the threshold time interval based on anumber of the at least two elements, and to extract the at least twoelements storing time within the new threshold time interval.
 32. Thepattern extraction apparatus of claim 29, wherein the processor isconfigured to track the ridge so that a thickness of an edge in theridge is equal to or less than a threshold thickness.
 33. The patternextraction apparatus of claim 23, wherein the processor is configured toset a region on the map from which the static pattern is to beextracted, and to extract a the ridge from the region based on athreshold time interval.
 34. The pattern extraction apparatus of claim33, wherein the processor is configured to set the region based on apart of the object corresponding to the event.
 35. The patternextraction apparatus of claim 33, wherein the processor is configured toadjust a length of the threshold time interval based on a number ofvalid event signals received in the region.
 36. The pattern extractionapparatus of claim 33, wherein the processor is configured to adjust alength of the threshold time interval in response to a new event signalbeing received in the region.
 37. The pattern extraction apparatus ofclaim 23, wherein the processor is configured to generate a plurality ofmaps corresponding to a plurality of depth regions based on theidentification and the time, and to extract a the ridge from at leastone of the plurality of maps.
 38. The pattern extraction apparatus ofclaim 37, further comprising a depth sensor configured to output a depthinformation corresponding to the event sensed by the event-based sensor,wherein the processor is configured to select a map from the pluralityof maps based on the depth information, and to update the map based onthe identification and the time.
 39. The pattern extraction apparatus ofclaim 37, further comprising a depth sensor configured to output a depthinformation corresponding to the event sensed by the event-based sensor,wherein the processor is configured to store the time and the depthinformation in an element identified by the identification from amongthe plurality of elements, and to extract the static pattern based onthe identification, the time, and the depth information.
 40. The patternextraction apparatus of claim 37, wherein the processor is configured togenerate a composite map based on the plurality of maps and extract thestatic pattern based on the composite map.
 41. A display apparatuscomprising a motion sensor comprising a plurality of sensing pixels andconfigured to output a signal representing a motion of an object,wherein the motion of the object is represented by time andcorresponding location information indicating at least one pixel sensingthe motion of the object among the plurality of sensing pixels; aprocessor configured to generate at least one map based on the locationinformation and the time, extract elements storing time within athreshold time interval among a plurality of elements included in themap, generate a new threshold time interval by adjusting a length of thethreshold time interval based on a number of the extracted elements, andextracting new elements within the new threshold time interval, anddetect the object based on the elements and the new elements, extractedby the processor, wherein the processor is configured to extract a ridgefrom the map, which is a 3D map.
 42. The display apparatus of claim 41,further comprising a display which displays the object.
 43. The displayapparatus of claim 41, wherein the processor controls the displayapparatus based on the object.
 44. The display apparatus of claim 41,wherein the motion of the object is a non-contact gesture of a user. 45.A pattern extraction apparatus comprising: an event-based sensorconfigured to generate time information and identification informationin response to an event, and output an event signal including the timeinformation and the identification information; and a memory configuredto store the time information and the identification information,wherein the event-based sensor is configured to determine whether achange in a log intensity of light detected by at least one pixel amonga plurality of pixels of the event-based sensor, after the event,exceeds a threshold, and to generate an ON event signal or an OFF eventsignal based on whether the change in the log intensity, after theevent, exceeds the threshold, wherein the identification informationcomprises location information of each of the plurality of pixels of theevent-based sensor that sensed the event and the time informationcomprises a time point in which the event is detected by a respectivepixel from among said each pixel, and wherein, based on the eventsignal, a pattern, representing an object, is extracted, by generating a3D map comprising a plurality of elements corresponding to the locationinformation of the plurality of pixels of the event-based sensor inwhich the time point is a value of a respective element from among theplurality of elements, and extracting a ridge from the 3D map.
 46. Thepattern extracting apparatus of claim 45, wherein, the event-basedsensor is further configured to: generate the ON event signal based onthe change in the log intensity after the event exceeds a firstthreshold, and generate the OFF event signal based on the change in thelog intensity after the event exceeds a second threshold that is lowerthan the first threshold.
 47. The pattern extracting apparatus of claim45, wherein the identification information further comprises an addressof the plurality of pixels included in the event-based sensor.
 48. Thepattern extracting apparatus of claim 45, wherein the map is a timestampmap that stores a latest time at which the time informationcorresponding to each of the plurality of elements is received, as atimestamp.
 49. The pattern extracting apparatus of claim 45, wherein atleast one pixel, sensing the event, among the plurality of pixels of theevent-based sensor is an active pixel.
 50. The pattern extractingapparatus of claim 49, wherein the active pixel is configured togenerate an activation signal in response to the event, and wherein theevent-based sensor is further configured to generate an event signalcomprising the time information and the identification information ofthe active pixel, based on the activation signal.
 51. The patternextracting apparatus of claim 50, wherein the event-based sensor isfurther configured to generate the event signal asynchronously.
 52. Thepattern extracting apparatus of claim 50, wherein the event-based sensoris further configured to generate a pass flag to identify a plurality ofevent signals being spatiotemporally associated with each other, and tofilter one of the plurality of event signals corresponding to backgroundnoise activity.
 53. A pattern extracting apparatus comprising: anevent-based sensor configured to generate time information andidentification information based on a movement of an object; and aprocessor configured to extract a static pattern corresponding to anappearance of the object in a state in which the object stops based onthe time information and the identification information, wherein theidentification information comprises location information of each of aplurality of pixels of the event-based sensor that sensed the movementof the object and the time comprises a time point in which the movementof the object is detected by a respective pixel from among said eachpixel, wherein the processor is configured to extract the static patternby generating a map comprising a plurality of elements corresponding tothe location information of the plurality of pixels of the event-basedsensor in which the time point is a value of a respective element fromamong the plurality of elements, and wherein the processer is furtherconfigured to track the static pattern to adjust a thickness of an edgeof the static pattern to be equal or less than a threshold thickness.54. The pattern extracting apparatus of claim 53, wherein theidentification information further comprises an address indicating atleast one pixel, from among the plurality of pixels, sensing themovement of the object.
 55. The pattern extracting apparatus of claim54, wherein the map is a timestamp map storing a timestamp correspondingto each of the plurality of elements.
 56. The pattern extractingapparatus of claim 55, wherein the processor is further configured toupdate the timestamp map by overwriting the timestamp corresponding toat least one of the plurality of elements with a new timestamp receivedfrom the event-based sensor.
 57. The pattern extracting apparatus ofclaim 54, wherein the processor is further configured to extract thestatic pattern based on the timestamp last stored in each of theplurality of elements.
 58. The pattern extracting apparatus of claim 55,wherein the processor is further configured to extract the staticpattern based on the timestamp within a threshold time interval.
 59. Thepattern extracting apparatus of claim 58, wherein the processor isfurther configured to adjust a length of the threshold time interval toset a number of the plurality of elements storing the timestamp withinthe threshold time interval being greater than a predetermined minimumnumber and lesser than a predetermined maximum number.
 60. The patternextracting apparatus of claim 58, wherein the processor is furtherconfigured to, based on the timestamp map comprising a first regioncorresponding to a first object and a second region corresponding to asecond object different from the first object, apply a first thresholdtime interval to the first region and a second threshold time intervalto the second region, the second threshold different being from thefirst threshold time interval.